Siemens SMART platform system
Description
Our
Siemens SMART 3-circle platform diffractometer was purchased with an NSF grant in
1994 (CHE-9422567) and upgraded with a KRYOFLEX low temperature device and an
APEX II CCD area detector via an NSF grant in 2004 (CHE-0342508).
The
X-ray source is a fine-focus sealed tube that delivers Mo Kα radiation (50 kV, 30 mA) through a graphite monochromator
and a MonoCap focusing collimator.
Experiments
Data
collections, which generally take from 12 to 24 hours, are performed at 100 K,
but temperatures of 90 to 300 K are available.
Data
collection, reduction, and correction are managed by the APEX4
suite of programs from Bruker.
Structure
solution, structure refinement, and report generation are performed with SHELX software.
Absolute
configuration can be determined for single crystals that contain at least one
element with a minimum of about 14 electrons (i.e., Si). Relative configuration
can always be assigned, so long as one stereocenter is known.
